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Defects in high-k gate dielectric stacks [Documento electrónico] : nano-electronic semiconductor devices / Evgeni Gusev

Main Author: GUSEV, EvgeniPublication: Dordrecht : Springer, 2006Description: E-bookISBN: 978-1-4020-4367-3.Series: NATO Science Series II, Mathematics, Physics and Chemistry, 220Subject - Topical Name: Engenharia Online Resources:Acesso online
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