Defect-oriented testing for nano-metric CMOS VLSI circuits [Documento electrónico] / Manoj Sachdev, José Pineda de Gyvez
Edition Statement: 2nd edPublication: Dordrecht : Springer, 2007Description: E-bookISBN: 978-0-387-46547-0.Series: Frontiers In Electronic Testing , 34Subject - Topical Name: Engenharia Online Resources:Acesso online| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Ebook | Biblioteca do ISEL | Available |
Total holds: 0
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