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Data mining and diagnosing IC fails [Documento electrónico] / Leendert M. Huisman

Main Author: HUISMAN, Leendert M.Publication: New York : Springer, 2005Description: E-bookISBN: 978-0-387-26351-9.Series: Frontiers In Electronic Testing, 31Subject - Topical Name: Engenharia Online Resources:Acesso online
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