000 00642nam a2200217 i 4500
001 9217
005 20170623142741.0
010 _a0-13-786310-1
090 _a9217
100 _a20170214 pory50
200 1 _aAnalog and mixed-signal test
_fBapiraju Vinnakota
210 _aUpper Saddle River
_cPrentice Hall
_d1998
215 _aXIX, 261 p.
_cil.
_d24 cm.
606 _910305
_aElectrónica
606 _912278
_aMicroelectrónica
606 _913858
_aCircuitos integrados lineares
606 _912384
_aSimulação
675 _a621.38
700 1 _aVINNAKOTA
_bBapiraju
_91481
852 _aISEL
_bBiblioteca Central
_gVIN.
_j621.38
942 _cMO