000 00641nam a2200205 i 4500
001 24161
005 20170214082248.0
010 _a978-1-84628-173-0
090 _a24161
100 _a20090323d2006 0pory50 ba
200 1 _aIntegrated circuit test engineering
_bDocumento electrónico
_e modern techniques
_fIan A. Grout
210 _aLondon
_cSpringer
_d2006
215 _aE-book
300 _aAcesso ao documento electrónico no ISEL
606 _910390
_aEngenharia
675 _a62
700 1 _aGROUT
_bIan A.
_912051
852 _aISEL
_bBiblioteca Central
856 _uhttp://www.springerlink.com/content/x5t16n/
_zAcesso online
942 _cEBO