000 | 00688nam a2200217 i 4500 | ||
---|---|---|---|
001 | 23915 | ||
005 | 20170214082223.0 | ||
010 | _a978-0-387-71754-8 | ||
090 | _a23915 | ||
100 | _a20081017d2007 0pory50 ba | ||
200 | 1 |
_aDigital noise monitoring of defect origin _bDocumento electrónico _fTelman Aliev |
|
210 |
_aNew York _cSpringer _d2007 |
||
215 | _aE-book | ||
225 | 1 |
_aLecture Notes in Electrical Engineering _v2 |
|
300 | _aAcesso ao documento electrónico no ISEL | ||
606 |
_910390 _aEngenharia |
||
675 | _a62 | ||
700 | 1 |
_aALIEV _bTelman _911819 |
|
852 |
_aISEL _bBiblioteca Central |
||
856 |
_uhttp://www.springerlink.com/content/v6508x/ _zAcesso online |
||
942 | _cEBO |