| 000 | 00689nam a2200217 i 4500 | ||
|---|---|---|---|
| 001 | 23877 | ||
| 005 | 20170214082219.0 | ||
| 010 | _a978-0-387-26351-9 | ||
| 090 | _a23877 | ||
| 100 | _a20081010d2005 0pory50 ba | ||
| 200 | 1 |
_aData mining and diagnosing IC fails _bDocumento electrónico _fLeendert M. Huisman |
|
| 210 |
_aNew York _cSpringer _d2005 |
||
| 215 | _aE-book | ||
| 225 | 1 |
_aFrontiers In Electronic Testing _v31 |
|
| 300 | _aAcesso ao documento electrónico no ISEL | ||
| 606 |
_910390 _aEngenharia |
||
| 675 | _a62 | ||
| 700 | 1 |
_aHUISMAN _bLeendert M. _911786 |
|
| 852 |
_aISEL _bBiblioteca Central |
||
| 856 |
_uhttp://www.springerlink.com/content/w5680m/ _zAcesso online |
||
| 942 | _cEBO | ||