Biblioteca do ISEL

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Caraterização do dano induzido por furação em materiais compósitos laminados / Marisa Sofia Faria Alves ; orient. Maria Amélia Ramos Loja, Inês de Carvalho Jerónimo Barbosa, Ivo Manuel Ferreira de Bragança Publication: Lisboa : ISEL - Área Departamental de Engenharia Mecânica, 2017Description: EbookAvailability: Items available for reference: (1).

Scanning microscopy for nanotechnology : techniques and applications / Weilie Zhou, Zhong Lin WangPublication: New York : Springer, 2007Description: XIV, 522 p. : il. ; 24 cm.Availability: Items available for loan: [ZHO. 621.38] (1).

Thin film analysis by X-ray scattering / Mario Birkholz ; contrib. Paul F. Fewster, Christoph GenzelPublication: Weinheim : WILEY-VCH, 2006Description: XXII, 356 p. : il. ; 25 cm.Availability: Items available for loan: [BIR. 538.9] (1).

Introduction to biomedical imaging / Andrew WebbPublication: Hoboken : John Wiley & Sons, 2003Description: XIII, 252 P. : il.Availability: Items available for loan: [WEB. 616.71] (1).

Elements of x-ray diffraction / B. D. Cullity, S. R. StockPublication: Upper Saddle River : Prentice Hall, 2001Description: XVIII, 664 p. : il. ; 24 cm.Availability: Items available for loan: [CUL. 538.9] (1). Checked out (1).

Medidas en procesos técnicos / Siemens AktiengesellschaftPublication: Madrid : Editorial Dossat, 1976Description: 360 p. : il. ; 22 cm.Availability: Items available for loan: [SIE. 53] (1).

Analisis instrumental : métodos fisicoquímicos del análisis / Paul Delahay ; trad. F. Burriel Marti, J. A. Burriel LlunaPublication: Madrid : Paraninfo, 1963Description: VIII, 466 p. : il. ; 23 cm.Availability: Items available for loan: [DEL. 543] (1).

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