			Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein... [et al.]Publication: New York : Springer, 2003Description: XIX, 690 p. : il. ; 26 cm. + CD-ROMAvailability: Items available for loan: [GOL. 620.18] (2). Place hold Add to cart (remove)
			No cover image available Multiple-beam interference microscopy of metals / S. TolanskyPublication: London : Academic Press, 1970Description: IX, 147 p. : il. ; 24 cm.Availability: Items available for loan: [TOL. 620.18] (1). Place hold Add to cart (remove)

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