Biblioteca do ISEL

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Elements of x-ray diffraction / B. D. Cullity, S. R. StockPublication: Upper Saddle River : Prentice Hall, 2001Description: XVIII, 664 p. : il. ; 24 cm.Availability: Items available for loan: [CUL. 538.9] (1). Checked out (1).

Fundamentals of powder diffraction and structural characterization of materials / Vitalij K. Pecharsky, Peter Y. ZavalijPublication: New York : Springer, 2005Description: XXIII, 713 p. : il. ; 24 cm + CD-ROMAvailability: Items available for loan: [PEC. 538.9] (2).

Thin film analysis by X-ray scattering / Mario Birkholz ; contrib. Paul F. Fewster, Christoph GenzelPublication: Weinheim : WILEY-VCH, 2006Description: XXII, 356 p. : il. ; 25 cm.Availability: Items available for loan: [BIR. 538.9] (1).

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