<![CDATA[Biblioteca do ISEL Search for 'an:12280 and se:IEE Circuits and Systems Series']]>

<![CDATA[Biblioteca do ISEL Search for 'an:12280 and se:IEE Circuits and Systems Series']]> https://biblioteca.isel.pt/cgi-bin/koha/opac-search.pl?q=ccl=an%3A12280%20%20and%20se%3AIEE%20Circuits%20and%20Systems%20Series&format=rss2 2 0 50 VLSI testing ISBN 0-85296-901-5 https://biblioteca.isel.pt/cgi-bin/koha/opac-detail.pl?biblionumber=11744 By Stanley L. Hurst. The Institution of Electrical Engineers 1998 . XX, 532 p. 0-85296-901-5

Place Hold on VLSI testing

]]> https://biblioteca.isel.pt/cgi-bin/koha/opac-detail.pl?biblionumber=11744 Low-power HF microelectronics ISBN 0-85296-874-4 https://biblioteca.isel.pt/cgi-bin/koha/opac-detail.pl?biblionumber=11941 By Gerson A. S. Machado. The Institution of Electrical Engineers 1996 . XXXIV, 1028 p. 0-85296-874-4

Place Hold on Low-power HF microelectronics

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