System test and diagnosis / William R. Simpson, John W. Sheppard
Publication: Boston : Kluwer, 1994Description: XVI, 382 p. : il. ; 24 cm.ISBN: 0-7923-9475-5.Subject - Topical Name: Electrónica | Circuitos electrónicos | Testes | Diagnóstico| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Livro | Biblioteca do ISEL | SIM. 621.38 (Browse shelf) | Available | 1009758 |
Total holds: 0
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| SIM. 621.3 Foundations of electrical engineering | SIM. 621.3 Pioneiros da electricidade em Portugal e outros estudos | SIM. 621.38 Industrial electronics | SIM. 621.38 System test and diagnosis | SIM. 621.38(043) Extracção lógica para análise de testabilidade de circuitos digitais CMOS | SIM. 621.39 Contemporary cryptology | SIM. 621.391 Bandwidth-efficient digital modulation with application to deep-space communications |
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