VLSI testing : digital and mixed analogue/digital techniques / Stanley L. Hurst
Publication: London : The Institution of Electrical Engineers, 1998Description: XX, 532 p. : il.ISBN: 0-85296-901-5.Series: IEE Circuits, and Systems Series / D. G. Haigh, 9Subject - Topical Name: Microelectrónica | VLSI | Circuitos digitais | Circuitos analógicos | Teste analógico | Teste digital| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Livro | Biblioteca do ISEL | HUR. 621.38Mic (Browse shelf) | Available | 1006898 |
Total holds: 0
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