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Semiconductor material and device characterization / Dieter K. Schroder

Main Author: SCHRODER, Dieter K.Edition Statement: 2nd edPublication: New York : John Wiley & Sons, 1998Description: XXIV, 760 p. : il. ; 24 cm.ISBN: 0-471-24139-3.Subject - Topical Name: Electrónica | Semicondutores | Testes dos materiais | Capacitância
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Item type Current location Call number Status Date due Barcode Item holds
Livro Biblioteca do ISEL SCH. 621.38 (Browse shelf) Available 1015448
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